1. J. Heckel, W. Scholz
Description of low-energy peak distortion observed in X-ray spectrometry with Si(Li) detectors
X-Ray Spectrometry Volume 16, Issue 4, Date: July 1987, Pages: 181-185
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http://dx.doi.org/10.1002/xrs.1300160409On the response function of solid-state detectors, based on energetic electron transport processes
X-Ray Spectrometry Volume 32, Issue 6, Date: November/December 2003, Pages: 458-469
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http://dx.doi.org/10.1002/xrs.672 A modified theoretical model for the efficiency calculations of a Si(Li) detector
X-Ray Spectrometry Volume 16, Issue 1, Date: January 1987, Pages: 3-6
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http://dx.doi.org/10.1002/xrs.1300160103 Escape peaks and internal fluorescence for a Si(Li) detector and general geometry // 1976 J. Phys. E: Sci. Instrum. 9 1023
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http://dx.doi.org/10.1088/0022-3735/9/11/040 Escape peak losses in Si(Li) detectors
X-Ray Spectrometry Volume 8, Issue 2, Date: April 1979, Pages: 65-67
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http://dx.doi.org/10.1002/xrs.1300080206