1. Sokolov, A. Loupilov, V. Gostilo
Semiconductor Peltier-cooled detectors for x-ray fluorescence analysis
X-Ray Spectrometry Volume 33 Issue 6, Pages 462 - 465
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http://dx.doi.org/10.1002/xrs.744Estimation of absorbing layer thicknesses for an Si(Li) detector
X-Ray Spectrometry Volume 28, Issue 1, Date: January/February 1999, Pages: 33-40
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http://dx.doi.org/10.1002/(SICI)1097-4539(199901/02)28:1<33::AID-XRS306>3.0.CO;2-Q