+++6 Powder Diffraction

[Ulens]

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1 The adaptation of a Philips PW1050 X-ray diffractometer system to incorporate an incident beam focusing monochromator: Design, assembly and characterisation
I. C. Madsen, R. J. Hill and G. Stereff
Powder Diffraction / Volume 11 / Issue 04 / December 1996, pp 290-296

DOI:

http://dx.doi.org/10.1017/S0885715600009271

2 Instrumental aspects in X-ray diffraction on polycrystalline materials
R. Guinebretière
Powder Diffraction / Volume 20 / Issue 04 / December 2005, pp 294-305

DOI:

http://dx.doi.org/10.1154/1.2136890

3 Walter N. Schreiner
A standard test method for the determination of RIR values by x-ray diffraction
Powder Diffraction / Volume 10 / Issue 01 / Март 1995, pp 25 - 33

DOI:

http://dx.doi.org/10.1017/S0885715600014263

4 Diffraction line profile from a disperse system: A simple alternative to Voigtian profiles
P. Scardi, M. Leoni and J. Faber
Powder Diffraction / Volume 21 / Issue 04 / Декабрь 2006, pp 270 - 277

DOI:

http://dx.doi.org/10.1154/1.2358359

5 The Background in X-Ray Powder Diffractograms: A Case Study of Rietveld Analysis of Minor Phases Using Ni-Filtered and Graphite-Monochromated Radiation
R.J. Hill
Powder Diffraction / Volume 7 / Issue 02 / Июнь 1992, pp 63 - 70

DOI:

http://dx.doi.org/10.1017/S088571560001825X

6 Notes on Slits and Monochromators in Accurate Powder Diffractometry
J. Timmers, N.M. van der Pers, G.J.M. Sprong, Th.H. de Keijser and R. Delhez
Powder Diffraction / Volume 7 / Issue 02 / Июнь 1992, pp 83 - 88

DOI:

http://dx.doi.org/10.1017/S0885715600018285

Заранее - большущее спасибо

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[Ulens]

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[Ulens]

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[Ivan110]

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