1.Trace element analysis by means of synchrotron radiation, XRF, and PIXE: selection of sample preparation procedure
Journal of Alloys and Compounds
Volume 328, Issues 1-2, 4 October 2001, Pages 283-288
W. M. Kwiatek B. Kubicaa, C. Paluszkiewicz, and M. GaIka
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http://dx.doi.org/10.1016/S0925-8388(01)01318-4
Nuclear Instruments and Methods in Physics Research Section A: Accelerators,Spectrometers,Detectors and Associated Equipment
Volume 470, Issues 1-2, 1 September 2001, Pages 437-440
V. N. Gorchakov, G. N. Dragunc, Y. P. Kolmogorov, V. A. Smelova, L. I. Tikhonova and Y. V. Tysjachnova
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http://dx.doi.org/10.1016/S0168-9002(01)01092-0
Journal of Electron Spectroscopy and Related Phenomena
Volumes 137-140, July 2004, Pages 801-804
Ari Ide-Ektessabi, Takuo Kawakami, Ryoko Ishihara, Yutaka Mizuno and Tohru Takeuchi
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http://dx.doi.org/10.1016/j.elspec.2004.02.152