1. Pattern-Based Recognition for Determination of Enantiomeric Excess, Using Chiral Auxiliary Induced Chemical Shift Perturbation NMR
Xinxiang Lei*†‡, Lu Liu†, Xiaojing Chen§, Xiaochun Yu†, Lisheng Ding‡ and Anjiang Zhang
Org. Lett., Article ASAP
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http://dx.doi.org/10.1021/ol100773s Garrison E. Beye and Dale E. Ward
J. Am. Chem. Soc., Article ASAP
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http://dx.doi.org/10.1021/ja102356j