1. Fu E.G., Misra A., Wang H., Shao L., Zhang X. - Interface enabled defects reduction in helium ion irradiated Cu/V nanolayers. // Journal of Nuclear Materials. 2010. V. 407. N. 3. P. 178 - 188.
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http://dx.doi.org/10.1016/j.jnucmat.2010.10.011
