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1. Quaternary selenodiphosphates(IV): MIMIII[P2Se6], (MI =Cu, Ag; MIII = Cr, Al, Ga, In)
Regine Pfeiffa and Rüdiger Kniep
Journal of Alloys and Compounds Volume 186, Issue 1, 24 July 1992, Pages 111-133

DOI:

http://dx.doi.org/10.1016/0925-8388(92)90626-K

2. Vibrational spectra and quantum chemical investigations of stoichiometric anions in the series
Tl2P2S6−xSex and Ag2P2S6−xSex with x=0–6. Evidence of the hexaselenidometadiphosphate anion, P2Se62−
Frank Menzela, Wolfgang Brocknera, and Martin Ystenes
Vibrational Spectroscopy Volume 14, Issue 1, March 1997, Pages 59-70

DOI:

http://dx.doi.org/10.1016/S0924-2031(96)00063-X

3. Relationship between structure parameters and chemical properties in some MPS3 layered phases
R. Brec, G. Ouvrard and J. Rouxel
Materials Research Bulletin Volume 20, Issue 11, November 1985, Pages 1257-1263

DOI:

http://dx.doi.org/10.1016/0025-5408(85)90118-7

4. New directions in synthetic solid state chemistry: chalcophosphate salt fluxes for discovery of new multinary solids
Mercouri G Kanatzidis
Current Opinion in Solid State and Materials Science Volume 2, Issue 2, April 1997, Pages 139-149

DOI:

http://dx.doi.org/10.1016/S1359-0286(97)80058-7

5. Modification of the cationic ordering with respect to the chalcogen in the layered MM'P2X6 phases.
Synthesis and structure of two-dimensional AgVP2Se6
G. Ouvrard and R. Brec
Materials Research Bulletin Volume 23, Issue 8, August 1988, Pages 1199-1209

DOI:

http://dx.doi.org/10.1016/0025-5408(88)90212-7

6.Copper sublattice ordering in layered CuMP2Se6 (M=In, Cr)
X. Bourdona, V. Maisonneuveb, V. B. Cajipea, *, C. Payena and J. E. Fischer
Journal of Alloys and Compounds Volume 283, Issues 1-2, 1 February 1999, Pages 122-127

DOI:

http://dx.doi.org/10.1016/S0925-8388(98)00899-8

7. Insertion of In(III) and Ga(III) into MPS3 (M = Mn, Cd) layered materials
Víctor Manríquez1, Antonio Galdámez1, Aníbal Villanueva2, Pilar Aranda2, Juan Carlos Galván2 and Eduardo Ruiz-Hitzky
Materials Research Bulletin Volume 34, Issue 5, 15 March 1999, Pages 673-683

DOI:

http://dx.doi.org/10.1016/S0025-5408(99)00059-8

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Спасибо, eFo!