++++IEEE Xplore Digital library (четыре)

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Уважаемые коллеги, помогите в поиске статтей
1. Automating testability analysis of analog circuits and systems
Kuhns, F.;
McDonnell Douglas Corp., St. Louis, MO
AUTOTESTCON '92. IEEE Systems Readiness Technology Conference, Conference Record
Issue Date: 21-24 Sep 1992
On page(s): 225 - 231
Meeting Date: 21 вер 1992 - 24 вер 1992
Location: Dayton, OH , USA

DOI:

http://dx.doi.org/10.1109/AUTEST.1992.270110

2. A virtual test-bench for analog circuit testability analysis and fault diagnosis
Chakrabarty, S.; Rajan, V.; Ying, J.; Mansjur, M.; Pattipati, K.; Deb, S.;
Dept. of Electr. & Syst. Eng., Connecticut Univ., Storrs, CT
AUTOTESTCON '98. IEEE Systems Readiness Technology Conference., 1998 IEEE
Issue Date: 24-27 Aug 1998
On page(s): 337 - 352
Meeting Date: 24 серп 1998 - 27 серп 1998
Location: Salt Lake City, UT , USA

DOI:

http://dx.doi.org/10.1109/AUTEST.1998.713467

3. Testability analysis of analog systems
Hemink, G.J.; Meijer, B.W.; Kerkhoff, H.G.;
Twente Univ.
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Issue Date: Jun 1990
Volume: 9 Issue:6
On page(s): 573 - 583

DOI:

http://dx.doi.org/10.1109/43.55186

4.Machine learning algorithms for fault diagnosis in analog circuits
Rajan, V.; Jie Yang; Chakrabarty, S.; Pattipati, K.;
Dept. of Electr. & Syst. Eng., Connecticut Univ., Storrs, CT
This paper appears in: Systems, Man, and Cybernetics, 1998. 1998 IEEE International Conference on
Issue Date: 11-14 Oct 1998
On page(s): 1874 - 1879 vol.2
Meeting Date: 11 жовт 1998 - 14 жовт 1998
Location: San Diego, CA , USA

DOI:

http://dx.doi.org/10.1109/ICSMC.1998.728169

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