1) Correlation between processing and properties of TiOxNy thin films sputter deposited by the reactive gas pulsing technique
N. Martin, O. Banakh, A. M. E. Santo, S. Springer, R. Sanjinés, J. Takadoum and F. Lévy
Applied Surface Science, Volume 185, Issues 1-2, 28 December 2001, Pages 123-133
- DOI:
http://dx.doi.org/10.1016/S0169-4332(01)00774-7
Ömer Kesmez, H. Erdem Çamurlu, Esin Burunkaya and Ertuğrul Arpaç
Solar Energy Materials and Solar Cells,Volume 93, Issue 10, October 2009, Pages 1833-1839
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http://dx.doi.org/10.1016/j.solmat.2009.06.022
Fanming Meng and Fei Lu
Vacuum, Volume 85, Issue 1, 23 July 2010, Pages 84-88
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http://dx.doi.org/10.1016/j.vacuum.2010.04.006
K. Drogowska, N.-T.H. Kim-Ngan, A.G. Balogh, M. Radecka, A. Brudnik, K. Zakrzewska and Z. Tarnawski
Surface Science, Volume 604, Issues 11-12, 15 June 2010, Pages 1010-1014
- DOI:
http://dx.doi.org/10.1016/j.susc.2010.03.010