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1. The effect of series resistance in electro-chemical carrier profiling / T Humer-Hager
// Semicond. Sci. Technol., V3, N6, p. 533, 1988.

DOI:

http://dx.doi.org/10.1088/0268-1242/3/6/007

2. On application of electrochemical capacitance–voltage profiling technique for n-type SiC /
M Mynbaeva, M Kayambaki, K Mynbaev and K Zekentes // Semicond. Sci. Technol., V23, N7, p. 5039,

2008.

DOI:

http://dx.doi.org/10.1088/0268-1242/23/7/075039

3. An automatic plotting system for the electrochemical characterization of n-type gallium

arsenide / E G Bremner, T Ambridge and C R Elliott // J. Phys. E: Sci. Instrum., V6, N4, p.

326, 1973.

DOI:

http://dx.doi.org/10.1088/0022-3735/6/4/005

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