+++1 Wiley - Surface and Interface Analysis

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Surface and Interface Analysis
Volume 11, Issue 8, pages 447–449, May 1988
"XPS and IR (ATR) analysis of Pd oxide films obtained by electrochemical methods"
1. Josep M. Tura1,
2. Pere Regull2,
3. Lluís Victori2,
4. M. Dolors de Castellar
Article first published online: 15 SEP 2004
DOI:

DOI:

http://dx.doi.org/10.1002/sia.740110807

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