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Effects of radio frequency bias frequency and radio frequency bias pulsing on SiO2 feature etching in inductively coupled fluorocarbon plasmas
M. Schaepkens, G. S. Oehrlein, and J. M. Cook
J. Vac. Sci. Technol. B 18, 856 (2000)
- DOI:
http://dx.doi.org/10.1116/1.591286