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http://dx.doi.org/10.1016/S0080-8784(08)63053-7или
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http://www.sciencedirect.com/science/article/pii/S0080878408630537Semiconductors and Semimetals
Volume 51, Part A, 1998, Pages 1–43
Identification of Defects in Semiconductors
Chapter 1 EPR and ENDOR Studies of Defects in Semiconductors
George D. Watkins