Characterization of Defects in Silicon Carbide by Raman Spectroscopy
1. Dr. Peter Friedrichs1
2. Prof. Dr. Tsunenobu Kimoto2,3
3. Prof. Dr. Lothar Ley4
4. Dr. Gerhard Pensl5
1. Martin Hundhausen,
2. Roland Püsche,
3. Jonas Röhrl,
4. Prof. Dr. Lothar Ley
- DOI:
http://dx.doi.org/10.1002/9783527629053.ch9